Wentworth Semi-Auto Probecard Station

Configured with a probcard this system can measure 30 channels simultaneously, allowing for the rapid characterisation of devices over an entire substrate. Predominantly used for TFT test, the Wentworth Semi-Auto Probecard system extracts full electrical characterisation parameters from 10 transistors in parallel.

The high throughput of this system can provide substrate scale device test and parameter mapping approaching the capabilities of volume manufacturing equipments and permits increased data gathering from time consuming characterisation such as Bias stress test.